For the first time, a single instrument merges groundbreaking nano-IR imaging and spectroscopy with confocal Raman micro-spectroscopy and high-quality Atomic Force Microscopy (AFM). Integrating both light-based (nano-FTIR) and force-based (tapping AFM-IR) cutting-edge nano-IR detection ensures the right technology for maximum performance on your specific sample.

Correlative confocal Raman spectroscopy extends the system application potential and significantly improves the quality of chemical identification. Integrated micro-IR based on the Laser Direct Infrared (LDIR) reflection-absorption spectroscopy provides easy identification of regions of interest and sample pre-characterization in the same instrument.

High-quality AFM provides superb nanoscale mechanical characterization. Revolutionary sample navigation, intelligent system automation and data management deliver benchmarking performance for nanoscale analytics applications with unrivaled data quality and ease of use.